From: Statistical analysis of the interaction between irradiation-induced defects and triple junctions
Property | Symbol | Value | Unit | Reference |
---|---|---|---|---|
Young’s modulus | E | 200 | GPa | – |
Poisson’s ratio | \(\nu \) | 0.3 | – | – |
Burger’s vector | b | 0.24855 | nm | – |
Gas constant | R | 8.314 | J (mol K)\(^{-1}\) | – |
Absolute temperature | T | 500 | K | – |
Boltzmann constant | \(k_b\) | \(8.617333\times 10^{-5}\) | eV K\(^{-1}\) | – |
Atomic volume | \(V_m\) | \(7.092329\times 10^{-6}\) | m\(^3\) mol\(^{-1}\) | – |
Defect implantation rate | \(f_\text {implantation}\) | \(10^{-3}\) | dpa s\(^{-1}\) | – |
CCE (SIA) | \(\eta _I\) | 0.484783 | – | – |
CCE (vacancy) | \(\eta _V\) | \(-\,0.193050\) | – | – |
Diffusion rate constant (SIA) | \(D_I^{(0)}\) | \(8.2369 \times 10^{-7}\) | m\(^2\) s\(^{-1}\) | [39] |
Diffusion rate constant (vacancy) | \(D_V^{(0)}\) | \(8.2369 \times 10^{-8}\) | m\(^2\) s\(^{-1}\) | [39] |
Migration energy (size 1 SIA) | \(E_m^{(I1)}\) | 0.34 | eV | [39] |
Migration energy (size 2 SIA) | \(E_m^{(I2)}\) | 0.42 | eV | [39] |
Migration energy (size 3 SIA) | \(E_m^{(I3)}\) | 0.43 | eV | [39] |
Migration energy (size 1 vacancy) | \(E_m^{(V1)}\) | 0.67 | eV | [39] |
Migration energy (size 2 vacancy) | \(E_m^{(V2)}\) | 0.62 | eV | [39] |
Migration energy (size 3 vacancy) | \(E_m^{(V3)}\) | 0.35 | eV | [39] |
Migration energy (size 4 vacancy) | \(E_m^{(V4)}\) | 0.48 | eV | [39] |
Binding energy (size 2 vacancy) | \(E_b^{(V2)}\) | 0.30 | eV | [39] |
Binding energy (size 3 vacancy) | \(E_b^{(V3)}\) | 0.37 | eV | [39] |
Binding energy (size 4 vacancy) | \(E_b^{(V4)}\) | 0.62 | eV | [39] |
Binding energy (size 2 SIA) | \(E_b^{(I2)}\) | 0.80 | eV | [39] |
Binding energy (size 3 SIA) | \(E_b^{(I3)}\) | 0.92 | eV | [39] |
Annihilation coefficient | \(Z_{ann}^{(0)}\) | 20 | – | – |